CVE-2022-33214

CVE-2022-33214

Memory corruption in display due to time-of-check time-of-use of metadata reserved size in Snapdragon Auto, Snapdragon Compute, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

Source: CVE-2022-33214

답글 남기기

이메일 주소는 공개되지 않습니다. 필수 항목은 *(으)로 표시합니다

Time limit is exhausted. Please reload the CAPTCHA.